Analysis of carrier traps in continuously operated 4,4′-bis[N-(1- naphthyl)-N-phenyl-amino]-biphenyl/tris(8-hydroxyquinoline)aluminum-based organic light-emitting diodes by thermally stimulated current measurement

Makoto Nakahara, Masahiro Minagawa, Takahito Oyamada, Toyoyasu Tadokoro, Hiroyuki Sasabe, Chihaya Adachi

研究成果: Contribution to journalArticle査読

18 被引用数 (Scopus)

抄録

We measured the reliability of two different organic light-emitting diodes (OLEDs) composed of indium tin oxide (ITO)/4,4′-bis[N-(1-naphthyl)-N- phenyl-amino]biphenyl (α-NPD)/tris(8-hydroxyquinoline)aluminum (Alq 3)/MgAg (two layer) or ITO/α-NPD/α-NPD:Alq3 (mixed layer)/Alq3/MgAg. Changes in the carrier trap distribution were estimated by thermally stimulated current (TSC) measurements. Improved device reliability was observed in the mixed-layer device. In the case of the two-layer device, the TSC peaks gradually changed depending on the duration of continuous operation, while the mixed device showed no change in its TSC spectra. These spectral differences indicate that the mixing of α-NPD and Alq3 occurs during the continuous operation in the two-layer device.

本文言語英語
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
46
25-28
DOI
出版ステータス出版済み - 7 13 2007

All Science Journal Classification (ASJC) codes

  • 工学(全般)
  • 物理学および天文学(その他)
  • 物理学および天文学(全般)

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