Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy

Atsushi Takahara, Daisuke Kawaguchi, Keiji Tanaka, M. Tozu, T. Hoshi, T. Kajiyama

研究成果: ジャーナルへの寄稿記事

8 引用 (Scopus)

抄録

Surface chemical composition of blend composed of monodisperse polystyrene (hPS) with the number-average molecular weight, M n , of 19.7 k and deuterated monodisperse polystyrene (dPS) with M n of 847 k was analyzed based on time-of-flight secondary ion mass spectroscopy (ToF-SIMS). Although hPS possess higher surface free energy than dPS, ToF-SIMS revealed that hPS was preferentially segregated at the outermost surface of the blend films with various compositions. The surface segregation of hPS can be explained in terms of the molecular weight disparity for both components, i.e., an entropic effect.

元の言語英語
ページ(範囲)538-540
ページ数3
ジャーナルApplied Surface Science
203-204
DOI
出版物ステータス出版済み - 1 15 2003

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Polystyrenes
Polymer blends
Surface structure
Spectroscopy
Ions
Molecular weight
Surface segregation
Chemical analysis
Free energy

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

これを引用

Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy. / Takahara, Atsushi; Kawaguchi, Daisuke; Tanaka, Keiji; Tozu, M.; Hoshi, T.; Kajiyama, T.

:: Applied Surface Science, 巻 203-204, 15.01.2003, p. 538-540.

研究成果: ジャーナルへの寄稿記事

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AU - Hoshi, T.

AU - Kajiyama, T.

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