Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy

A. Takahara, D. Kawaguchi, K. Tanaka, M. Tozu, T. Hoshi, T. Kajiyama

研究成果: Contribution to journalArticle査読

8 被引用数 (Scopus)

抄録

Surface chemical composition of blend composed of monodisperse polystyrene (hPS) with the number-average molecular weight, M n , of 19.7 k and deuterated monodisperse polystyrene (dPS) with M n of 847 k was analyzed based on time-of-flight secondary ion mass spectroscopy (ToF-SIMS). Although hPS possess higher surface free energy than dPS, ToF-SIMS revealed that hPS was preferentially segregated at the outermost surface of the blend films with various compositions. The surface segregation of hPS can be explained in terms of the molecular weight disparity for both components, i.e., an entropic effect.

本文言語英語
ページ(範囲)538-540
ページ数3
ジャーナルApplied Surface Science
203-204
DOI
出版ステータス出版済み - 1 15 2003

All Science Journal Classification (ASJC) codes

  • 化学 (全般)
  • 凝縮系物理学
  • 物理学および天文学(全般)
  • 表面および界面
  • 表面、皮膜および薄膜

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