The availability of laser ablation atomic fluorescence (LAAF) spectroscopy for the nano-meter scale analysis of the sample surface was demonstrated. With the use of polymer samples of the Na-doped polymethyl methacrylate (PMMA), a limit of detection in the trace element analysis of Na was acquired as 36 fg. In addition, the LAAF technique was also applied for the trace element analysis of phosphorus contained in the n-type Si.
|出版ステータス||出版済み - 2000|
All Science Journal Classification (ASJC) codes