Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

M. K. Kim, H. Ishii, T. Takao, Yuji Oki, M. Maeda

研究成果: Contribution to journalArticle査読

抄録

The availability of laser ablation atomic fluorescence (LAAF) spectroscopy for the nano-meter scale analysis of the sample surface was demonstrated. With the use of polymer samples of the Na-doped polymethyl methacrylate (PMMA), a limit of detection in the trace element analysis of Na was acquired as 36 fg. In addition, the LAAF technique was also applied for the trace element analysis of phosphorus contained in the n-type Si.

本文言語英語
ページ(範囲)512-513
ページ数2
ジャーナルUnknown Journal
出版ステータス出版済み - 2000

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(全般)

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