Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

M. K. Kim; H. Ishii; T. Takao; Yuji Oki; M. Maeda

Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

M. K. Kim, H. Ishii, T. Takao, Yuji Oki, M. Maeda

I&Eビジョナリー特別部門

研究成果: ジャーナルへの寄稿 › 学術誌 › 査読

抄録

The availability of laser ablation atomic fluorescence (LAAF) spectroscopy for the nano-meter scale analysis of the sample surface was demonstrated. With the use of polymer samples of the Na-doped polymethyl methacrylate (PMMA), a limit of detection in the trace element analysis of Na was acquired as 36 fg. In addition, the LAAF technique was also applied for the trace element analysis of phosphorus contained in the n-type Si.

本文言語	英語
ページ（範囲）	512-513
ページ数	2
ジャーナル	Unknown Journal
出版ステータス	出版済み - 2000

!!!All Science Journal Classification (ASJC) codes

物理学および天文学（全般）

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title = "Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy",

abstract = "The availability of laser ablation atomic fluorescence (LAAF) spectroscopy for the nano-meter scale analysis of the sample surface was demonstrated. With the use of polymer samples of the Na-doped polymethyl methacrylate (PMMA), a limit of detection in the trace element analysis of Na was acquired as 36 fg. In addition, the LAAF technique was also applied for the trace element analysis of phosphorus contained in the n-type Si.",

author = "Kim, {M. K.} and H. Ishii and T. Takao and Yuji Oki and M. Maeda",

year = "2000",

language = "English",

pages = "512--513",

journal = "Quaternary International",

issn = "1040-6182",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

AU - Kim, M. K.

AU - Ishii, H.

AU - Takao, T.

AU - Oki, Yuji

AU - Maeda, M.

PY - 2000

Y1 - 2000

N2 - The availability of laser ablation atomic fluorescence (LAAF) spectroscopy for the nano-meter scale analysis of the sample surface was demonstrated. With the use of polymer samples of the Na-doped polymethyl methacrylate (PMMA), a limit of detection in the trace element analysis of Na was acquired as 36 fg. In addition, the LAAF technique was also applied for the trace element analysis of phosphorus contained in the n-type Si.

AB - The availability of laser ablation atomic fluorescence (LAAF) spectroscopy for the nano-meter scale analysis of the sample surface was demonstrated. With the use of polymer samples of the Na-doped polymethyl methacrylate (PMMA), a limit of detection in the trace element analysis of Na was acquired as 36 fg. In addition, the LAAF technique was also applied for the trace element analysis of phosphorus contained in the n-type Si.

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UR - http://www.scopus.com/inward/citedby.url?scp=0034548308&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0034548308

SP - 512

EP - 513

JO - Quaternary International

JF - Quaternary International

SN - 1040-6182

ER -

Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

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!!!All Science Journal Classification (ASJC) codes

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