By utilizing time-of-flight secondary ion mass spectrometry (TOF-SIMS), the degradation processes of quantum dot core components and the surface ligands were studied. Intentionally degraded QLED samples were prepared, and the TOF-SIMS mass composition signals of each layer within the QLEDs are estimated. The result of the analysis gives possible structural information of the degraded species induced in the device, providing useful insights for further developments of highly efficientR/G/B quantum dotmaterials.
|ジャーナル||Digest of Technical Papers - SID International Symposium|
|出版ステータス||出版済み - 2022|
|イベント||59th International Symposium, Seminar and Exhibition, Display Week 2022 - San Jose, 米国|
継続期間: 5月 8 2022 → 5月 13 2022
!!!All Science Journal Classification (ASJC) codes