Analyzing the Degradation Process of Quantum-Dot LEDs (QLEDs) by Mass Spectrometryf

Hin Wai Mo, Daichi Shirakura, Kentaro Harada, Kiyoshi Ishibashi, Takahiro Shibamori, Takashi Miyamoto, Chihaya Adachi

研究成果: ジャーナルへの寄稿会議記事査読

抄録

By utilizing time-of-flight secondary ion mass spectrometry (TOF-SIMS), the degradation processes of quantum dot core components and the surface ligands were studied. Intentionally degraded QLED samples were prepared, and the TOF-SIMS mass composition signals of each layer within the QLEDs are estimated. The result of the analysis gives possible structural information of the degraded species induced in the device, providing useful insights for further developments of highly efficientR/G/B quantum dotmaterials.

本文言語英語
ページ(範囲)1-4
ページ数4
ジャーナルDigest of Technical Papers - SID International Symposium
53
1
DOI
出版ステータス出版済み - 2022
イベント59th International Symposium, Seminar and Exhibition, Display Week 2022 - San Jose, 米国
継続期間: 5月 8 20225月 13 2022

!!!All Science Journal Classification (ASJC) codes

  • 工学(全般)

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