Anisotropic stress-sensitive temperature dependence of the lattice constant of silicon

Yuji Soejima, K. Inoue, T. Kawahara, N. Ohama, A. Okazaki

研究成果: ジャーナルへの寄稿記事

6 引用 (Scopus)

抄録

The previous experiment of high-angle double-crystal X-ray diffraction (HADOX) performed on silicon at low temperatures showed a very anomalous behaviour of a(T), the lattice constant as a function of temperature. An extensive study has since been made under various conditions of specimen crystals. The results are in contradiction with the common belief that the silicon crystal with the diamond structure is rigid and stable: It is found that the anomaly is rather sensitive to external stresses and that the behaviour of a(T) can therefore be very complicated. It is also found that the anomaly is anisotropic, namely largest in (111) direction and smallest in (110) direction. The apparent irreproducible behaviour of a(T) is attributed to an atomic rearrangement with a long relaxation time.

元の言語英語
ページ(範囲)2431-2436
ページ数6
ジャーナルJournal of Physics C: Solid State Physics
18
発行部数12
DOI
出版物ステータス出版済み - 4 30 1985

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Silicon
Lattice constants
temperature dependence
Crystals
silicon
anomalies
crystals
Rigid structures
Diamond
rigid structures
Relaxation time
Temperature
Diamonds
relaxation time
diamonds
X ray diffraction
diffraction
x rays
Experiments
temperature

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Engineering(all)
  • Physics and Astronomy(all)

これを引用

Anisotropic stress-sensitive temperature dependence of the lattice constant of silicon. / Soejima, Yuji; Inoue, K.; Kawahara, T.; Ohama, N.; Okazaki, A.

:: Journal of Physics C: Solid State Physics, 巻 18, 番号 12, 30.04.1985, p. 2431-2436.

研究成果: ジャーナルへの寄稿記事

Soejima, Yuji ; Inoue, K. ; Kawahara, T. ; Ohama, N. ; Okazaki, A. / Anisotropic stress-sensitive temperature dependence of the lattice constant of silicon. :: Journal of Physics C: Solid State Physics. 1985 ; 巻 18, 番号 12. pp. 2431-2436.
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