Application of a laboratory xafs spectrometer to characterization of aluminium in an amorphous aluminosilicate

Yoshio Ikeda, Takushi Yokoyama, Seiichi Yamashita, Hisanobu Wakita

研究成果: Contribution to journalArticle査読

3 被引用数 (Scopus)

抄録

Using a Laboratory XAFS(X-ray absorption fine structure) spectrometer, the local structure of aluminium in an aluminosilicate with a Si/Al atomic ratio of 1/3 was studied. From the XAFS data, the average Al-0 interatomic distance and coordination number of aluminium atoms were estimated. In addition, the assignment of the XANES(X-ray absorption nearedge structure) spectra for aluminium was discussed based on the27A1 MAS NMR spectra of the corresponding samples.

本文言語英語
ページ(範囲)670-672
ページ数3
ジャーナルJapanese journal of applied physics
32
DOI
出版ステータス出版済み - 1 1993

All Science Journal Classification (ASJC) codes

  • 工学(全般)
  • 物理学および天文学(全般)

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