APPLICATION OF ATOM PROBE-FIELD ION MICROSCOPE TO FERROUS MATERIALS.

Ryuji Uemori; Mitsuru Tanino

APPLICATION OF ATOM PROBE-FIELD ION MICROSCOPE TO FERROUS MATERIALS.

研究成果: Contribution to journal › Article › 査読

抄録

The atom probe-field ion microscope (N-FIM) facilitates observation of atomic arrangement in the specimen surface with high resolution and identification of species of individual atoms by high-sensitivity mass spectroscopy. The AP-FIM produced detailed knowledge on such small specimen regions that could not be clearly analyzed by conventional electron microscopy. The principle of the AP-FIM is explained, and the results of AP-FIM analysis of ultra-fine precipitates formed at the peak stage of secondary hardening in a tempered Mo steel is briefly described.

本文言語	英語
ページ（範囲）	48-54
ページ数	7
ジャーナル	Nippon Steel Technical Report
号	33
出版ステータス	出版済み - 4 1 1987
外部発表	はい

All Science Journal Classification (ASJC) codes

Mechanics of Materials
Metals and Alloys
Materials Chemistry

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引用スタイル

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abstract = "The atom probe-field ion microscope (N-FIM) facilitates observation of atomic arrangement in the specimen surface with high resolution and identification of species of individual atoms by high-sensitivity mass spectroscopy. The AP-FIM produced detailed knowledge on such small specimen regions that could not be clearly analyzed by conventional electron microscopy. The principle of the AP-FIM is explained, and the results of AP-FIM analysis of ultra-fine precipitates formed at the peak stage of secondary hardening in a tempered Mo steel is briefly described.",

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