抄録
The atom probe-field ion microscope (N-FIM) facilitates observation of atomic arrangement in the specimen surface with high resolution and identification of species of individual atoms by high-sensitivity mass spectroscopy. The AP-FIM produced detailed knowledge on such small specimen regions that could not be clearly analyzed by conventional electron microscopy. The principle of the AP-FIM is explained, and the results of AP-FIM analysis of ultra-fine precipitates formed at the peak stage of secondary hardening in a tempered Mo steel is briefly described.
本文言語 | 英語 |
---|---|
ページ(範囲) | 48-54 |
ページ数 | 7 |
ジャーナル | Nippon Steel Technical Report |
号 | 33 |
出版ステータス | 出版済み - 4月 1 1987 |
外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 材料力学
- 金属および合金
- 材料化学