Application of ATR-FTIR spectroscopy combined with sputter etching for depth profiling of a chemical additive within a pulp fiber

Daisuke Tatsumi, Tatsuo Yamauchi

研究成果: Contribution to journalArticle査読

12 被引用数 (Scopus)

抄録

Attenuated total reflectance-Fourier transform infrared (ATR-FTIR) spectroscopy in combination with the sputter etching technique was applied to the determination of the depth distribution of a chemical additive within a pulp fiber. After etching successively, the surface additive content was determined by ATR-FTIR spectroscopy. Sputter etching until 5 min was homogeneous and proportional to obtain precise depth profile. From the relationship between etching time and the thickness of removed surface layer, it is possible to follow the partial concentration profile of the additive es a function of distance from the original surface. The obtained profile is compared qualitatively with that of variable-angle ATR-FTIR depth profiling method. The profile shows that most of the additive is located at the fiber surface; however, some of it is broadly distributed toward the inside of the fiber. The present method can be used to clarify the distribution of other paper additives within a pulp fiber, and, moreover, it can be applied to depth profiling of a minor component within a solid material.

本文言語英語
ページ(範囲)461-468
ページ数8
ジャーナルJournal of Applied Polymer Science
69
3
DOI
出版ステータス出版済み - 7 18 1998
外部発表はい

All Science Journal Classification (ASJC) codes

  • 化学 (全般)
  • 表面、皮膜および薄膜
  • ポリマーおよびプラスチック
  • 材料化学

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