Application of laser ablation atomic fluorescence spectroscopy for nanometer solid surface analysis

M. K. Kim, H. Ishii, K. Taoka, Y. Oki, M. Maeda

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抜粋

Laser ablation is well established as a tool for surface processing. Various types of materials ranging from polymers to inorganic crystals and metals have been extensively studied. Laser-induced ablation of solid surface makes an accurate vaporization of the surface possible, and most of the species in the ablation plume are in the atomic state. We have developed an extremely sensitive atomic detection method called LAAF (Laser Ablation Atomic Fluorescence) spectroscopy. In LAAF spectroscopy, the ablation was used to atomize the sample surface, and atoms in the ablation plume were detected by laser-induced fluorescence (LIF) spectroscopy. In the detection of Na atoms in pure water, we had acquired the limit of detection such as 0.6 fg for signal-to-noise ratio (SIN) as unity. This LAAF spectroscopy is one of the most sensitive techniques in trace element analysis, and is presently applied to solid surface analysis. In the work, LAAF spectroscopy is applied for nanometer solid surface analysis of Na-doped poly-methylmethacrylate (PMMA). The analysis is also extended to silicon and different metals.

元の言語英語
ホスト出版物のタイトルCLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics
出版者Institute of Electrical and Electronics Engineers Inc.
ページ1194-1195
ページ数2
ISBN(電子版)0780356616, 9780780356610
DOI
出版物ステータス出版済み - 1 1 1999
イベント1999 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 1999 - Seoul, 大韓民国
継続期間: 8 30 19999 3 1999

出版物シリーズ

名前CLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics
4

その他

その他1999 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 1999
大韓民国
Seoul
期間8/30/999/3/99

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications
  • Physics and Astronomy(all)

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  • これを引用

    Kim, M. K., Ishii, H., Taoka, K., Oki, Y., & Maeda, M. (1999). Application of laser ablation atomic fluorescence spectroscopy for nanometer solid surface analysis. : CLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics (pp. 1194-1195). [814731] (CLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics; 巻数 4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.1999.814731