Application of the quantitative-phase and crystal-structure simultaneous analysis to the X-ray diffraction data obtained by synchrotron gandolfi camera system

Quantitative-phase and crystal-structure simultaneous analysis method has been successfully developed by applying the multi-phase Rietveld refinement to the diffraction data obtained by synchrotron Gandolfi camera system. This newly developed analytical method has been applied to diffraction experiments with micro-amount extraterrestrial samples, which the diameter is a hundred micrometers or less, and the mineral composition ratio of crystalline phase included in the sample has been successfully determined. As the crystal structure is also refined in Rietveld analysis by this method, the structural information of each mineral phase are simultaneously obtained. This method is a totally non-distractive quantitative-phase analysis method and will be a new and unique analytical method for planetary material science.