Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy

Kenji Kaneko, Ryo Nagayama, Koji Inoke, Etsuko Noguchi, Zenji Horita

研究成果: ジャーナルへの寄稿記事

5 引用 (Scopus)

抄録

When a dilute amount of Si is added to Al, it results in the precipitation of Si-phases, either planar- and/or rod-type, depending on the ageing conditions. Observation of these phases had been carried out by TEM two dimensionally so far; nevertheless information of the thickness as well as the distribution had been neglected in the past. In this paper, a combination of electron diffraction, high-resolution transmission electron microscopy, and three-dimensional electron tomography was applied to characterize the morphologies and the orientation relationship of the Si-phases in an Al-Si alloy.

元の言語英語
ページ(範囲)726-731
ページ数6
ジャーナルScience and Technology of Advanced Materials
7
発行部数7
DOI
出版物ステータス出版済み - 10 1 2006

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High resolution transmission electron microscopy
Electron diffraction
Tomography
Aging of materials
Transmission electron microscopy
Imaging techniques
Electrons

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

これを引用

Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy. / Kaneko, Kenji; Nagayama, Ryo; Inoke, Koji; Noguchi, Etsuko; Horita, Zenji.

:: Science and Technology of Advanced Materials, 巻 7, 番号 7, 01.10.2006, p. 726-731.

研究成果: ジャーナルへの寄稿記事

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