TY - JOUR
T1 - Atom-by-Atom and Sheet-by-Sheet Chemical Mechanical Polishing of Diamond Assisted by OH Radicals
T2 - A Tight-Binding Quantum Chemical Molecular Dynamics Simulation Study
AU - Kawaguchi, Kentaro
AU - Wang, Yang
AU - Xu, Jingxiang
AU - Ootani, Yusuke
AU - Higuchi, Yuji
AU - Ozawa, Nobuki
AU - Kubo, Momoji
N1 - Funding Information:
This research was supported by MEXT as “Exploratory Challenge on Post-K Computer” (Challenge of Basic Science - Exploring Extremes through Multi-Physics and Multi-Scale Simulations), JST CREST, JSPS Grant-in-Aid for Young Scientists (B) (Grant No. 26820029 and 17K14430), JSPS Grant-in-Aid for Scientific Research (A) (Grant Nos. 16H02305, 18H03751, and 19H00734), and JSPS Grant-in-Aid for Scientific Research (C) (Grant Nos. 17K06110, 19K05380, and 20K05147). We also gratefully acknowledge the Center for Computational Materials Science (CCMS, Tohoku University) for allowing the use of the MAterials science Supercomputing system for Advanced MUlti-scale simulations towards NExt-generation - Institute for Materials Research (MASAMUNE-IMR) (Grant No. 18S0403, 19S0506, and 20S0509).
Publisher Copyright:
© 2021 American Chemical Society.
PY - 2021/9/1
Y1 - 2021/9/1
N2 - Ultraflat and damage-free single-crystal diamond is a promising material for use in electronic devices such as field-effect transistors. Diamond surfaces are conventionally prepared by the chemical mechanical polishing (CMP) method, although the CMP efficiency remains a critical issue owing to the extremely high hardness of diamond. Recently, OH radicals have been demonstrated to be potentially useful for improving the CMP efficiency for diamond; however, the underlying mechanisms are still elusive. In this work, we applied our previously developed CMP-specialized tight-binding quantum chemical molecular dynamics simulator to comprehensively elucidate the CMP mechanisms of diamond assisted by OH radicals. Our simulation results indicate that the diamond surface is oxidized by reactions with OH radicals and then a concomitant surface reconstruction takes place due to the distorted and unstable nature of the oxidized diamond surface structure. Furthermore, we interestingly reveal that the reconstruction of the diamond surface ultimately leads to two distinct removal mechanisms: (i) gradual atom-by-atom removal through the desorption of gaseous molecules (e.g., CO2 and H2CO3) and (ii) drastic sheet-by-sheet removal through the exfoliation of graphitic ring structures. Hence, we propose that promoting the oxidation-induced graphitization of the diamond surface may provide a route to further improving the CMP efficiency.
AB - Ultraflat and damage-free single-crystal diamond is a promising material for use in electronic devices such as field-effect transistors. Diamond surfaces are conventionally prepared by the chemical mechanical polishing (CMP) method, although the CMP efficiency remains a critical issue owing to the extremely high hardness of diamond. Recently, OH radicals have been demonstrated to be potentially useful for improving the CMP efficiency for diamond; however, the underlying mechanisms are still elusive. In this work, we applied our previously developed CMP-specialized tight-binding quantum chemical molecular dynamics simulator to comprehensively elucidate the CMP mechanisms of diamond assisted by OH radicals. Our simulation results indicate that the diamond surface is oxidized by reactions with OH radicals and then a concomitant surface reconstruction takes place due to the distorted and unstable nature of the oxidized diamond surface structure. Furthermore, we interestingly reveal that the reconstruction of the diamond surface ultimately leads to two distinct removal mechanisms: (i) gradual atom-by-atom removal through the desorption of gaseous molecules (e.g., CO2 and H2CO3) and (ii) drastic sheet-by-sheet removal through the exfoliation of graphitic ring structures. Hence, we propose that promoting the oxidation-induced graphitization of the diamond surface may provide a route to further improving the CMP efficiency.
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U2 - 10.1021/acsami.1c09468
DO - 10.1021/acsami.1c09468
M3 - Article
C2 - 34403585
AN - SCOPUS:85114097117
SN - 1944-8244
VL - 13
SP - 41231
EP - 41237
JO - ACS applied materials & interfaces
JF - ACS applied materials & interfaces
IS - 34
ER -