Axial and lateral displacement measurements of a microsphere based on the critical-angle method

Eiji Higurashi, Renshi Sawada, Takahiro Ito

研究成果: ジャーナルへの寄稿学術誌査読

5 被引用数 (Scopus)

抄録

A method has been developed for optically measuring nanometer-scale displacements of transparent and metal-coated microspheres in both the axial (vertical) and lateral (horizontal) directions. This method works by detecting changes in the internal reflection of a laser beam reflected from the microsphere after it passes through critical-angle prisms. For weakly reflective 10-μm-diameter polystyrene microspheres in water (relative refractive index n = 1.2), the detection resolutions as estimated from the full-width at half maximum (FWHM) noise level in the frequency region above 500 Hz in the axial and lateral directions were experimentally found to be as good as 1.7 and 1.1 nm, respectively. Furthermore, the lateral displacement resolution (0.2 nm) of a 10-μm-diameter metal-coated microsphere was better than the axial displacement resolution (0.9 nm) of a conventional flat mirror by more than a factor of four.

本文言語英語
ページ(範囲)4191-4196
ページ数6
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
37
7
DOI
出版ステータス出版済み - 7月 1998
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 工学(全般)
  • 物理学および天文学(全般)

フィンガープリント

「Axial and lateral displacement measurements of a microsphere based on the critical-angle method」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル