Band alignment of Ga2O3/Si heterojunction interface measured by X-ray photoelectron spectroscopy
Zhengwei Chen, Kazuo Nishihagi, Xu Wang, Katsuhiko Saito, Tooru Tanaka, Mitsuhiro Nishio, Makoto Arita, Qixin Guo
研究成果: ジャーナルへの寄稿 › 学術誌 › 査読
46
被引用数
(Scopus)