The broadening of resistivity curves is measured for a c-axis-in-plane- aligned a-axis-oriented YBa2Cu3Ox epitaxial thin film in the vicinity of the superconducting transition in magnetic fields up to 12 T with various current and magnetic-direction configurations. The direction of the magnetic field with respect to the crystallographic axis is the most important factor governing the broadening of the resistive transition. The direction of the current with respect to the crystallographic axis and to the magnetic-field direction is of less importance. Based on the results, flux-flow resistivity is extracted for the film in the 12-T magnetic field running parallel to the c-axis direction.
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