CAT: A critical-area-targeted test set modification scheme for reducing launch switching activity in at-speed scan testing

K. Enokimoto, X. Wen, Y. Yamato, K. Miyase, H. Sone, S. Kajihara, M. Aso, H. Furukawa, H. Furukawa

研究成果: 書籍/レポート タイプへの寄稿会議への寄与

12 被引用数 (Scopus)

抄録

Reducing excessive launch switching activity (LSA) is now mandatory in at-Speed scan testing for avoiding test-Induced yield loss, and test set modification is preferable for this purpose. However, previous low-LSA test set modification methods may be ineffective since they are not targeted at reducing launch switching activity in the areas around long sensitized paths, which are spatially and temporally critical for test-Induced yield loss. This paper proposes a novel CAT (Critical-Area-Targeted) low-LSA test modification scheme, which uses long sensitized paths to guide launch-Safety checking, test relaxation, and X-Filling. As a result, launch switching activity is reduced in a pinpoint manner, which is more effective for avoiding test-Induced yield loss. Experimental results on industrial circuits demonstrate the advantage of the CAT scheme for reducing launch switching activity in at-Speed scan testing.

本文言語英語
ホスト出版物のタイトルProceedings of the 18th Asian Test Symposium, ATS 2009
ページ99-104
ページ数6
DOI
出版ステータス出版済み - 2009
イベント18th Asian Test Symposium, ATS 2009 - Taichung, 台湾
継続期間: 11月 23 200911月 26 2009

出版物シリーズ

名前Proceedings of the Asian Test Symposium
ISSN(印刷版)1081-7735

その他

その他18th Asian Test Symposium, ATS 2009
国/地域台湾
CityTaichung
Period11/23/0911/26/09

!!!All Science Journal Classification (ASJC) codes

  • 電子工学および電気工学

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