Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L12-type Ni3(Al, Ta)

Z. Horita, M. R. McCartney, H. Kuninaka

    研究成果: ジャーナルへの寄稿学術誌査読

    7 被引用数 (Scopus)

    抄録

    Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni3(Al, Ta) intermetallic compound with the L12-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the A1 and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the A1 and Ni columns.

    本文言語英語
    ページ(範囲)153-167
    ページ数15
    ジャーナルPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
    75
    1
    DOI
    出版ステータス出版済み - 1月 1997

    !!!All Science Journal Classification (ASJC) codes

    • 電子材料、光学材料、および磁性材料
    • 材料科学(全般)
    • 凝縮系物理学
    • 物理学および天文学(その他)
    • 金属および合金

    フィンガープリント

    「Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L12-type Ni3(Al, Ta)」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

    引用スタイル