Characterization of critical volume for percolation in Sn/Si bimetallic cluster assemblies with various packing fractions

Yuichiro Kurokawa, Takehiko Hihara

研究成果: Contribution to journalArticle査読

2 被引用数 (Scopus)

抄録

Sn1-x/Six cluster assembled films were prepared using a plasma-gas-condensation cluster beam deposition apparatus by energetic cluster impact deposition, and their conductivities were measured for various compositional ratios and packing fractions f. We found that the electrical conductivity σ of Sn1-x/Six cluster assembled films obeys a power law of the Sn concentration pSn. The marked change at approximately pSn = pc, indicates that the percolation of Sn clusters takes place at the threshold value pc. Moreover, we successfully demonstrated using Sn1-x/Six cluster assembled films with various f values that the critical volume fractions of a percolating object, υc = fpc, can be invariant with respect to f.

本文言語英語
論文番号054714
ジャーナルjournal of the physical society of japan
83
5
DOI
出版ステータス出版済み - 5 15 2014
外部発表はい

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(全般)

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