Characterization of DLC films by EELS and electron holography

Daisuke Shindo, Takayuki Musashi, Yoichi Ikematsu, Yasukazu Murakami, Norikazu Nakamura, Hiroshi Chiba

研究成果: ジャーナルへの寄稿記事

10 引用 (Scopus)

抄録

Thickness measurements of diamond-like carbon (DLC) films by electron energy-loss spectroscopy (EELS) and electron holography are discussed. In order to evaluate the thickness by EELS and electron holography, the mean free path for inelastic scattering and mean inner potential of DLC films were determined precisely, respectively. It is found that both the mean free path for inelastic electron scattering and the mean inner potential are sensitive to the preparation methods, namely the density of DLC films. The present work has demonstrated that thickness measurement by EELS is available to DLC films thicker than 20 nm, while electron holography can be applied to thinner films (∼5 nm). Furthermore, close relations are observed between the density of DLC films and the energy-loss spectra.

元の言語英語
ページ(範囲)11-17
ページ数7
ジャーナルJournal of Electron Microscopy
54
発行部数1
DOI
出版物ステータス出版済み - 6 2 2005
外部発表Yes

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Electron Energy-Loss Spectroscopy
Holography
Electron holography
Diamond like carbon films
Diamond
Electron energy loss spectroscopy
holography
Carbon
energy dissipation
diamonds
Electrons
electron energy
carbon
Inelastic scattering
Thickness measurement
spectroscopy
electrons
mean free path
inelastic scattering
Electron scattering

All Science Journal Classification (ASJC) codes

  • Instrumentation

これを引用

Characterization of DLC films by EELS and electron holography. / Shindo, Daisuke; Musashi, Takayuki; Ikematsu, Yoichi; Murakami, Yasukazu; Nakamura, Norikazu; Chiba, Hiroshi.

:: Journal of Electron Microscopy, 巻 54, 番号 1, 02.06.2005, p. 11-17.

研究成果: ジャーナルへの寄稿記事

Shindo, D, Musashi, T, Ikematsu, Y, Murakami, Y, Nakamura, N & Chiba, H 2005, 'Characterization of DLC films by EELS and electron holography', Journal of Electron Microscopy, 巻. 54, 番号 1, pp. 11-17. https://doi.org/10.1093/jmicro/dfh096
Shindo, Daisuke ; Musashi, Takayuki ; Ikematsu, Yoichi ; Murakami, Yasukazu ; Nakamura, Norikazu ; Chiba, Hiroshi. / Characterization of DLC films by EELS and electron holography. :: Journal of Electron Microscopy. 2005 ; 巻 54, 番号 1. pp. 11-17.
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AU - Nakamura, Norikazu

AU - Chiba, Hiroshi

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