抄録
The authors have investigated the effects of a low-temperature ZnTe buffer layer on structural and optical properties of ZnTe epilayers grown on (100) GaAs substrates by transmission electron microscopy and photoluminescence measurements. It has been found that the low-temperature ZnTe buffer layer can reduce the defects such as disordered region in the ZnTe buffer layer and suppress the dislocations at the ZnTe surface region, resulting in the formation of a high quality ZnTe epilayer grown on the low-temperature buffer layer.
本文言語 | 英語 |
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論文番号 | 021508 |
ジャーナル | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
巻 | 30 |
号 | 2 |
DOI | |
出版ステータス | 出版済み - 3月 2012 |
!!!All Science Journal Classification (ASJC) codes
- 凝縮系物理学
- 表面および界面
- 表面、皮膜および薄膜