Characterization of thermal transport in multiwalled carbon nanotube using FIB irradiation

Koji Takahashi, Hiroyuki Hayashi

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抜粋

Thermal conductance of an individual multiwalled carbon nanotube was measured as a function of its length. Focused ion beam was used to shorten a 4.8 micrometer-long nanotube to 2.4, 1.2, 0.6, and 0.3-micrometer-long specimens on a hot-film sensor. As the nanotube is shorten, the conductance decreases more than expected by the diffusive thermal conduction theory. We treated two nanotubes of 64nm and 85nm diameters, both of which showed quasi-ballistic phonon transport. This is the first experiment to quantitatively investigate the contribution of phonons with long free paths in multiwalled carbon nanotube. The principle of thermal measurement, amorphous carbon induced by the ion beam, and considerable errors are also explained.

元の言語英語
ホスト出版物のタイトルThermomechanical Phenomena in Electronic Systems -Proceedings of the Intersociety Conference
出版者Institute of Electrical and Electronics Engineers Inc.
ページ1375-1378
ページ数4
ISBN(電子版)9781479952670
DOI
出版物ステータス出版済み - 9 4 2014
イベント14th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2014 - Orlando, 米国
継続期間: 5 27 20145 30 2014

出版物シリーズ

名前Thermomechanical Phenomena in Electronic Systems -Proceedings of the Intersociety Conference

その他

その他14th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2014
米国
Orlando
期間5/27/145/30/14

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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  • これを引用

    Takahashi, K., & Hayashi, H. (2014). Characterization of thermal transport in multiwalled carbon nanotube using FIB irradiation. : Thermomechanical Phenomena in Electronic Systems -Proceedings of the Intersociety Conference (pp. 1375-1378). [6892439] (Thermomechanical Phenomena in Electronic Systems -Proceedings of the Intersociety Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ITHERM.2014.6892439