Collapse Tests on 1/10-Scale Hull Girder Model of Chip Carrier in Sagging

Tetsuya Yao, Masahiko Fujikubo, Daisuke Yanagihara, Isshin Fujii

研究成果: 著書/レポートタイプへの貢献会議での発言

抄録

In the present paperresults of buc kling collapse tests on 1/10-scale w elded steel hull girder models of a chip carrier in sagging are reported. Two models were pro vided, one with carlings at the top of the side shellplating and the other without carlings. It has been found that the buckling collapse of the deck plating as a stiffened plate together with local panel buckling at the top of side shell plating was the trigger of the overall collapse of the hull girder subjected to pure bending moment in sagging. Theoretical analysis was also performed applying the Smith's method. It was confirmed that the calculated and measured results show similar characteristics.

元の言語英語
ホスト出版物のタイトルProceedings of the International Offshore and Polar Engineering Conference
ページ2626-2633
ページ数8
出版物ステータス出版済み - 12 1 2003
外部発表Yes
イベントProceedings of the Thirteenth (2003) International Offshore and Polar Engineering Conference - Honolulu, HI, 米国
継続期間: 5 25 20025 30 2003

その他

その他Proceedings of the Thirteenth (2003) International Offshore and Polar Engineering Conference
米国
Honolulu, HI
期間5/25/025/30/03

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Plating
Buckling
Bending moments
Steel

All Science Journal Classification (ASJC) codes

  • Ocean Engineering

これを引用

Yao, T., Fujikubo, M., Yanagihara, D., & Fujii, I. (2003). Collapse Tests on 1/10-Scale Hull Girder Model of Chip Carrier in Sagging. : Proceedings of the International Offshore and Polar Engineering Conference (pp. 2626-2633)

Collapse Tests on 1/10-Scale Hull Girder Model of Chip Carrier in Sagging. / Yao, Tetsuya; Fujikubo, Masahiko; Yanagihara, Daisuke; Fujii, Isshin.

Proceedings of the International Offshore and Polar Engineering Conference. 2003. p. 2626-2633.

研究成果: 著書/レポートタイプへの貢献会議での発言

Yao, T, Fujikubo, M, Yanagihara, D & Fujii, I 2003, Collapse Tests on 1/10-Scale Hull Girder Model of Chip Carrier in Sagging. : Proceedings of the International Offshore and Polar Engineering Conference. pp. 2626-2633, Proceedings of the Thirteenth (2003) International Offshore and Polar Engineering Conference, Honolulu, HI, 米国, 5/25/02.
Yao T, Fujikubo M, Yanagihara D, Fujii I. Collapse Tests on 1/10-Scale Hull Girder Model of Chip Carrier in Sagging. : Proceedings of the International Offshore and Polar Engineering Conference. 2003. p. 2626-2633
Yao, Tetsuya ; Fujikubo, Masahiko ; Yanagihara, Daisuke ; Fujii, Isshin. / Collapse Tests on 1/10-Scale Hull Girder Model of Chip Carrier in Sagging. Proceedings of the International Offshore and Polar Engineering Conference. 2003. pp. 2626-2633
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