Emission intensity ε from plasmas is a complicated function of electron temperature Te and electron density ne. To understand the dependence of ε on Te and ne, an experimental comparison between tomography data (local ε of ArII) and Langmuir probe data (Te and ne) in a linear plasma device PANTA is presented in this paper. In the comparison, the local emission intensity is modeled as εmodel / Teαn2e, and the model is validated by calculating both cross-correlation function and least squares of residuals between the fluctuations of ε and εmodel. The comparison reveals that the both methods provide α = 2.3–2.7, higher than 2 that of the exponent of ne. This result confirms that dependence of Te on ε is larger than that of ne when Te is low, as in PANTA.
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