Comparison between Tomography and Langmuir Probe Data in PANTA

Yoshihiko Nagashima, Akihide Fujisawa, Kotaro Yamasaki, Shigeru Inagaki, Chanho Moon, Fumiyoshi Kin, Yuichi Kawachi, Hiroyuki Arakawa, Takuma Yamada, Tatsuya Kobayashi, Naohiro Kasuya, Yusuke Kosuga, Makoto Sasaki, Takeshi Ido

研究成果: Contribution to journalArticle査読

1 被引用数 (Scopus)

抄録

Emission intensity ε from plasmas is a complicated function of electron temperature Te and electron density ne. To understand the dependence of ε on Te and ne, an experimental comparison between tomography data (local ε of ArII) and Langmuir probe data (Te and ne) in a linear plasma device PANTA is presented in this paper. In the comparison, the local emission intensity is modeled as εmodel / Teαn2e, and the model is validated by calculating both cross-correlation function and least squares of residuals between the fluctuations of ε and εmodel. The comparison reveals that the both methods provide α = 2.3–2.7, higher than 2 that of the exponent of ne. This result confirms that dependence of Te on ε is larger than that of ne when Te is low, as in PANTA.

本文言語英語
論文番号093501
ジャーナルjournal of the physical society of japan
89
9
DOI
出版ステータス出版済み - 9 15 2020

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(全般)

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