Compensation of temperature-drift errors in fundamental-mode orthogonal fluxgates

Anton Plotkin, Eugene Paperno, Alexander Samohin, Ichiro Sasada

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

3 被引用数 (Scopus)

抄録

A new method for the temperature-compensation of fundamental-mode orthogonal fl uxgates that does not require additional hardware has been proposed and implemented. The method is based on the employme nt of one of the two fluxgate transfer characteristics and the ph ase of the corresponding output signal. The measurement accordin g to the proposed method can be done during a single, unipolar eye le of the flu xgate excitation. This doubles the me asurement update rate compared to conventional methods. The proposed method reduces temperaturedrift errors by an order of magnitude. The fluxgate prototype has demonstrated a 20-fold (down to 100 ppm/°C) reduction of the temperature-drift errors.

本文言語英語
ホスト出版物のタイトルIMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
ページ1201-1204
ページ数4
DOI
出版ステータス出版済み - 2006
イベントIMTC'06 - IEEE Instrumentation and Measurement Technology Conference - Sorrento, イタリア
継続期間: 4 24 20064 27 2006

出版物シリーズ

名前Conference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN(印刷版)1091-5281

その他

その他IMTC'06 - IEEE Instrumentation and Measurement Technology Conference
Countryイタリア
CitySorrento
Period4/24/064/27/06

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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引用スタイル