Consideration of the formation mechanism of an Al2O3-HfO2 eutectic film on a SiC substrate

Kyosuke Seya, Shunkichi Ueno, Toshiyuki Nishimura, Byung Koog Jang

研究成果: ジャーナルへの寄稿学術誌査読

抄録

An Al2O3-HfO2 eutectic EBC film was prepared on a SiC substrate by using the electric furnace heating and the optical zone melting methods. All of Al2O3 phase disappeared during the heating step at a temperature below the melting point, and all of the HfO2 phase reacted with the carbon and boron, which are included in SiC bulk as sintering agents, during the heating step at a temperature below the melting point. The thermal decomposition of the SiC phase, the reduction reaction of Al2O3 phase, the vaporization of the Al2O3 component, the reduction reaction of HfO2 and the formation of the HfC phase occurred at a temperature below the melting point. However, a highly dense HfC phase was formed on the SiC substrate. A rapid heating process becomes possible by using the optical zone melting method. A solidified film that was composed of a highly dense HfC layer as the intermediate layer and the Al2O3-HfO2 eutectic structure layer as the top coat was obtained by using the optical zone melting method.

本文言語英語
ページ(範囲)73-76
ページ数4
ジャーナルJournal of the Korean Physical Society
68
1
DOI
出版ステータス出版済み - 1月 1 2016
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 物理学および天文学(全般)

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