抄録
The rotation of the magnetization in the submicron-scale crossing region was investigated by measuring the Hall resistance. The Hall resistance showed unique behaviors with changing the direction of the applied magnetic field. It was found that the magnetization showed three discrete rotations caused by the magnetization switches of the probe wires during the magnetization reversal at any direction of the applied magnetic field. In order to control the position where the HR jump appears, several types of cross-shaped wires were also fabricated. Minor loops of the HR curves were also investigated.
本文言語 | 英語 |
---|---|
ページ(範囲) | 286-291 |
ページ数 | 6 |
ジャーナル | Journal of Magnetism and Magnetic Materials |
巻 | 248 |
号 | 2 |
DOI | |
出版ステータス | 出版済み - 7 1 2002 |
外部発表 | はい |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics