Control of magnetization rotation using submicron-wide cross geometry

Takashi Kimura, Fujio Wakaya, Kenji Gamo

研究成果: ジャーナルへの寄稿記事

2 引用 (Scopus)

抄録

The rotation of the magnetization in the submicron-scale crossing region was investigated by measuring the Hall resistance. The Hall resistance showed unique behaviors with changing the direction of the applied magnetic field. It was found that the magnetization showed three discrete rotations caused by the magnetization switches of the probe wires during the magnetization reversal at any direction of the applied magnetic field. In order to control the position where the HR jump appears, several types of cross-shaped wires were also fabricated. Minor loops of the HR curves were also investigated.

元の言語英語
ページ(範囲)286-291
ページ数6
ジャーナルJournal of Magnetism and Magnetic Materials
248
発行部数2
DOI
出版物ステータス出版済み - 7 1 2002
外部発表Yes

Fingerprint

Magnetization
Hall resistance
magnetization
Geometry
geometry
Wire
Magnetic fields
Magnetization reversal
wire
Switches
magnetic fields
switches
probes
curves
Direction compound

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

これを引用

Control of magnetization rotation using submicron-wide cross geometry. / Kimura, Takashi; Wakaya, Fujio; Gamo, Kenji.

:: Journal of Magnetism and Magnetic Materials, 巻 248, 番号 2, 01.07.2002, p. 286-291.

研究成果: ジャーナルへの寄稿記事

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