Critical charge dependence of correlation of different neutron sources for soft error testing

Hiroko Mori, Taiki Uemura, Hideya Matsuyama, Shin Ichiro Abe, Yukinobu Watanabe

研究成果: 著書/レポートタイプへの貢献会議での発言

抄録

We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.

元の言語英語
ホスト出版物のタイトル2015 IEEE International Reliability Physics Symposium, IRPS 2015
出版者Institute of Electrical and Electronics Engineers Inc.
ページ2C31-2C35
ISBN(電子版)9781467373623
DOI
出版物ステータス出版済み - 5 26 2015
イベントIEEE International Reliability Physics Symposium, IRPS 2015 - Monterey, 米国
継続期間: 4 19 20154 23 2015

出版物シリーズ

名前IEEE International Reliability Physics Symposium Proceedings
2015-May
ISSN(印刷物)1541-7026

その他

その他IEEE International Reliability Physics Symposium, IRPS 2015
米国
Monterey
期間4/19/154/23/15

Fingerprint

Neutron sources
Testing
Test facilities
Sea level

All Science Journal Classification (ASJC) codes

  • Engineering(all)

これを引用

Mori, H., Uemura, T., Matsuyama, H., Abe, S. I., & Watanabe, Y. (2015). Critical charge dependence of correlation of different neutron sources for soft error testing. : 2015 IEEE International Reliability Physics Symposium, IRPS 2015 (pp. 2C31-2C35). [7112678] (IEEE International Reliability Physics Symposium Proceedings; 巻数 2015-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS.2015.7112678

Critical charge dependence of correlation of different neutron sources for soft error testing. / Mori, Hiroko; Uemura, Taiki; Matsuyama, Hideya; Abe, Shin Ichiro; Watanabe, Yukinobu.

2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 2C31-2C35 7112678 (IEEE International Reliability Physics Symposium Proceedings; 巻 2015-May).

研究成果: 著書/レポートタイプへの貢献会議での発言

Mori, H, Uemura, T, Matsuyama, H, Abe, SI & Watanabe, Y 2015, Critical charge dependence of correlation of different neutron sources for soft error testing. : 2015 IEEE International Reliability Physics Symposium, IRPS 2015., 7112678, IEEE International Reliability Physics Symposium Proceedings, 巻. 2015-May, Institute of Electrical and Electronics Engineers Inc., pp. 2C31-2C35, IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, 米国, 4/19/15. https://doi.org/10.1109/IRPS.2015.7112678
Mori H, Uemura T, Matsuyama H, Abe SI, Watanabe Y. Critical charge dependence of correlation of different neutron sources for soft error testing. : 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 2C31-2C35. 7112678. (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/IRPS.2015.7112678
Mori, Hiroko ; Uemura, Taiki ; Matsuyama, Hideya ; Abe, Shin Ichiro ; Watanabe, Yukinobu. / Critical charge dependence of correlation of different neutron sources for soft error testing. 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 2C31-2C35 (IEEE International Reliability Physics Symposium Proceedings).
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