抄録
The so-called punchthrough phenomenon occurring in a logic gate using a Josephson tunnel junction is studied theoretically. An analytical solution of the Josephson equation describing the dynamic behavior of the Josephson gate in its resetting process is obtained with the modified averaged Lagrangian method. The solution leads to an expression for the punchthrough probability, which is capable of quantitative discussion and is applicable to arbitrary waveforms of the gate current. From the obtained expression, a study is made of the waveform dependence of the punchthrough probability, as well as its dependence on junction parameters. It is shown that the present analytical results agree well with those of computer simulations.
| 元の言語 | 英語 |
|---|---|
| ページ（範囲） | 8894-8900 |
| ページ数 | 7 |
| ジャーナル | Journal of Applied Physics |
| 巻 | 53 |
| 発行部数 | 12 |
| DOI | |
| 出版物ステータス | 出版済み - 1982 |
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All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
これを引用
Current-waveform dependence of punchthrough probability in a Josephson tunnel junction. / Enpuku, Keiji; Irie, F.; Nagatsuma, T.; Yoshida, K.
：: Journal of Applied Physics, 巻 53, 番号 12, 1982, p. 8894-8900.研究成果: ジャーナルへの寄稿 › 記事
}
TY - JOUR
T1 - Current-waveform dependence of punchthrough probability in a Josephson tunnel junction
AU - Enpuku, Keiji
AU - Irie, F.
AU - Nagatsuma, T.
AU - Yoshida, K.
PY - 1982
Y1 - 1982
N2 - The so-called punchthrough phenomenon occurring in a logic gate using a Josephson tunnel junction is studied theoretically. An analytical solution of the Josephson equation describing the dynamic behavior of the Josephson gate in its resetting process is obtained with the modified averaged Lagrangian method. The solution leads to an expression for the punchthrough probability, which is capable of quantitative discussion and is applicable to arbitrary waveforms of the gate current. From the obtained expression, a study is made of the waveform dependence of the punchthrough probability, as well as its dependence on junction parameters. It is shown that the present analytical results agree well with those of computer simulations.
AB - The so-called punchthrough phenomenon occurring in a logic gate using a Josephson tunnel junction is studied theoretically. An analytical solution of the Josephson equation describing the dynamic behavior of the Josephson gate in its resetting process is obtained with the modified averaged Lagrangian method. The solution leads to an expression for the punchthrough probability, which is capable of quantitative discussion and is applicable to arbitrary waveforms of the gate current. From the obtained expression, a study is made of the waveform dependence of the punchthrough probability, as well as its dependence on junction parameters. It is shown that the present analytical results agree well with those of computer simulations.
UR - http://www.scopus.com/inward/record.url?scp=0020271725&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0020271725&partnerID=8YFLogxK
U2 - 10.1063/1.330444
DO - 10.1063/1.330444
M3 - Article
VL - 53
SP - 8894
EP - 8900
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 12
ER -