Defect chemistry of oxides in partially frozen-in states: Case studies for ZrO2(Y2O3), SrZrO3(Y2O3), and SrTiO3

K. Sasaki, J. Claus, J. Maier

研究成果: Contribution to journalConference article査読

29 被引用数 (Scopus)

抄録

The low temperature defect chemistry is analyzed for ZrO2(Y2O3), SrZrO3(Y2O3), and SrTiO3. In this temperature regime, the oxygen incorporation is no longer in equilibrium but the internal ionization reaction of electrons (holes) with redox-active impurities is still reversible. The concentration of ions with a specific valence state is quantified by EPR for ZrO2(Y2O3), while the electrical conductivity is considered for SrZrO3(Y2O3) and SrTiO3. It is shown that the experimental low-temperature results can well be explained in this way. If the experiments are appropriately conducted, an additional degree of freedom is introduced, which is the freezing-in temperature. The technological and scientific relevance with respect to materials research is discussed.

本文言語英語
ページ(範囲)51-60
ページ数10
ジャーナルSolid State Ionics
121
1
DOI
出版ステータス出版済み - 6 1999
外部発表はい
イベントProceedings of the 1997 11th International Conference on Solid State Ionics, SSI-97 - Honolulu, HI, USA
継続期間: 11 16 199711 21 1997

All Science Journal Classification (ASJC) codes

  • 化学 (全般)
  • 材料科学(全般)
  • 凝縮系物理学

フィンガープリント

「Defect chemistry of oxides in partially frozen-in states: Case studies for ZrO<sub>2</sub>(Y<sub>2</sub>O<sub>3</sub>), SrZrO<sub>3</sub>(Y<sub>2</sub>O<sub>3</sub>), and SrTiO<sub>3</sub>」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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