Depth profiles of damage accumulation in UO2 and (U, Gd)O2 pellets irradiated with 100 MeV iodine ions

K. Nogita, K. Hayashi, K. Une, K. Fukuda

研究成果: Contribution to journalArticle査読

14 被引用数 (Scopus)

抄録

To study the initial defect formation and accumulation process during fission events, sliced pellet specimens of UO2 and (U, Gd)O2 were irradiated at ambient temperatures below 200°C, with 100 MeV iodine ions over a fluence range of 1.0 × 1018 - 2.0 × 1019 ions/m2. The surface of the specimens was analyzed by scanning electron microscopy (SEM) and X-ray diffractometry (XRD), and then the depth profiles of incident iodine ions and defect clusters were measured by secondary ion mass spectrometry (SIMS) and transmission electron microscopy (TEM), respectively. Lattice parameter change, which is associated with point defect accumulation, increased with ion fluence. Defect clusters of dislocations and dislocation loops were recognized, and their depth profiles were in good agreement with the calculated damage profile. These profiles of iodine ions and dislocation loops in both UO2 and (U, Gd)O2 were discussed in terms of inelastic and elastic collisions.

本文言語英語
ページ(範囲)302-309
ページ数8
ジャーナルJournal of Nuclear Materials
273
3
DOI
出版ステータス出版済み - 8 1 1999

All Science Journal Classification (ASJC) codes

  • 核物理学および高エネルギー物理学
  • 材料科学(全般)
  • 原子力エネルギーおよび原子力工学

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