抄録
In this letter, the optimum center-to-center separation between vias in the conductor-backed coplanar waveguide (CBCPW) is presented for leakage suppression in the dielectric region. Leakage mechanism at high frequencies associated with surface wave or parallel-plate mode were widely studied in the past. In this work, antenna arrays have been used to compare leakage in CPW and CBCPW feed network at S-band. By using identical antenna elements, CPW-fed slot dipole antenna array has been compared against CBCPW-fed slot dipole antenna array with a ground via fence. Instead of using shorting pins with minimum nonzero gap, optimum center-to-center separation distance between vias has been derived from the bandgap phenomenon. Approximately 20% of total loss across the frequency range of interest in CPW feed network obtained from the comparison of the CPW-fed antenna array against the CBCPW-fed antenna array can be attributed to unwanted leakage in the dielectric substrate.
| 元の言語 | 英語 |
|---|---|
| ページ（範囲） | 1257-1260 |
| ページ数 | 4 |
| ジャーナル | Microwave and Optical Technology Letters |
| 巻 | 58 |
| 発行部数 | 5 |
| DOI | |
| 出版物ステータス | 出版済み - 5 1 2016 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering
これを引用
Derivation of the optimum distance between periodically spaced vias for leakage suppression at S-band. / Eu Guan, Chai; Yoshitomi, Kuniaki; Kanaya, Haruichi.
：: Microwave and Optical Technology Letters, 巻 58, 番号 5, 01.05.2016, p. 1257-1260.研究成果: ジャーナルへの寄稿 › 記事
}
TY - JOUR
T1 - Derivation of the optimum distance between periodically spaced vias for leakage suppression at S-band
AU - Eu Guan, Chai
AU - Yoshitomi, Kuniaki
AU - Kanaya, Haruichi
PY - 2016/5/1
Y1 - 2016/5/1
N2 - In this letter, the optimum center-to-center separation between vias in the conductor-backed coplanar waveguide (CBCPW) is presented for leakage suppression in the dielectric region. Leakage mechanism at high frequencies associated with surface wave or parallel-plate mode were widely studied in the past. In this work, antenna arrays have been used to compare leakage in CPW and CBCPW feed network at S-band. By using identical antenna elements, CPW-fed slot dipole antenna array has been compared against CBCPW-fed slot dipole antenna array with a ground via fence. Instead of using shorting pins with minimum nonzero gap, optimum center-to-center separation distance between vias has been derived from the bandgap phenomenon. Approximately 20% of total loss across the frequency range of interest in CPW feed network obtained from the comparison of the CPW-fed antenna array against the CBCPW-fed antenna array can be attributed to unwanted leakage in the dielectric substrate.
AB - In this letter, the optimum center-to-center separation between vias in the conductor-backed coplanar waveguide (CBCPW) is presented for leakage suppression in the dielectric region. Leakage mechanism at high frequencies associated with surface wave or parallel-plate mode were widely studied in the past. In this work, antenna arrays have been used to compare leakage in CPW and CBCPW feed network at S-band. By using identical antenna elements, CPW-fed slot dipole antenna array has been compared against CBCPW-fed slot dipole antenna array with a ground via fence. Instead of using shorting pins with minimum nonzero gap, optimum center-to-center separation distance between vias has been derived from the bandgap phenomenon. Approximately 20% of total loss across the frequency range of interest in CPW feed network obtained from the comparison of the CPW-fed antenna array against the CBCPW-fed antenna array can be attributed to unwanted leakage in the dielectric substrate.
UR - http://www.scopus.com/inward/record.url?scp=84961840075&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84961840075&partnerID=8YFLogxK
U2 - 10.1002/mop.29776
DO - 10.1002/mop.29776
M3 - Article
VL - 58
SP - 1257
EP - 1260
JO - Microwave and Optical Technology Letters
JF - Microwave and Optical Technology Letters
SN - 0895-2477
IS - 5
ER -