Design of a single chip antenna combined with coplanar matching circuit and duplexer

Haruichi Kanaya, Kenta Seki, Keiji Yoshida

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抜粋

We designed the on-chip antenna combined with coplanar waveguide (CPW) broadband impedance matching circuit and duplexers with BPFs. Firstly, we designed a slot antenna with a radiation resistance matched to a three-pole bandpass filter (BPF) with 10.5GHz center frequency and 8% fractional bandwidth. Next, in order to obtain the high isolation from transmitter (Tx) to receiver (Rx), we attached the phase control line, which can be used as impedance matching, in front of each BPF in a duplexer. Finally, we design the Tx-and Rx-BPF matched to the input impedance of the antenna and phase control line. In the duplexer, Rx 2-pole BPF has center frequency=10.3GHz and bandwidth=40MHz, and Tx BPF has center frequency=10.7GHz and bandwidth=40MHz.

元の言語英語
ホスト出版物のタイトル2005 66th ARFTG Microwave Measurement Conference
ホスト出版物のサブタイトルDigital Communication System Metrics, ARFTG 2005
出版者Institute of Electrical and Electronics Engineers Inc.
ページ1-4
ページ数4
ISBN(電子版)9781538672921
DOI
出版物ステータス出版済み - 6 5 2018
イベント66th ARFTG Microwave Measurement Conference: Digital Communication System Metrics, ARFTG 2005 - Washington, 米国
継続期間: 12 1 200512 2 2005

出版物シリーズ

名前2005 66th ARFTG Microwave Measurement Conference: Digital Communication System Metrics, ARFTG 2005

その他

その他66th ARFTG Microwave Measurement Conference: Digital Communication System Metrics, ARFTG 2005
米国
Washington
期間12/1/0512/2/05

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Instrumentation
  • Radiation

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  • これを引用

    Kanaya, H., Seki, K., & Yoshida, K. (2018). Design of a single chip antenna combined with coplanar matching circuit and duplexer. : 2005 66th ARFTG Microwave Measurement Conference: Digital Communication System Metrics, ARFTG 2005 (pp. 1-4). (2005 66th ARFTG Microwave Measurement Conference: Digital Communication System Metrics, ARFTG 2005). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ARFTG.2005.8373128