Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering

H. Téllez, R. J. Chater, S. Fearn, E. Symianakis, H. H. Brongersma, J. A. Kilner

    研究成果: Contribution to journalArticle査読

    11 被引用数 (Scopus)

    抄録

    Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He scattered by 18O-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for E i 0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for E i > 2 keV. The ion fractions P were determined for Si and O using the characteristic velocity method to quantify the surface density. The 18O/ 16O sensitivity ratio indicates an 18 higher sensitivity for the heavier O isotope.

    本文言語英語
    論文番号151602
    ジャーナルApplied Physics Letters
    101
    15
    DOI
    出版ステータス出版済み - 10 8 2012

    All Science Journal Classification (ASJC) codes

    • 物理学および天文学(その他)

    フィンガープリント

    「Determination of <sup>16</sup>O and <sup>18</sup>O sensitivity factors and charge-exchange processes in low-energy ion scattering」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

    引用スタイル