Deuterium retention in Toughened, Fine-Grained Recrystallized Tungsten

M. Oya, K. Uekita, H. T. Lee, Y. Ohtsuka, Y. Ueda, H. Kurishita, A. Kreter, J. W. Coenen, V. Philipps, S. Brezinsek, A. Litnovsky, K. Sugiyama, Y. Torikai

研究成果: ジャーナルへの寄稿学術誌査読

19 被引用数 (Scopus)

抄録

Deuterium retention in Toughened, Fine-Grained Recrystallized W (TFGR W-1.1 wt%TiC) was studied, compared to pure W. D implantation was performed to a fluence of 1 × 1024m 2 at temperatures of 473-873 K, followed by TDS. It was found that D retention in TFGR W is higher than in pure W at all irradiation temperatures. Namely, at 673 K, D retention in TFGR W is six times higher than pure W. TDS spectrum of TFGR W irradiated at 573 Khas a large peak around ∼700 K with small shoulder up to ∼1100 K. In the case of D + He simultaneous irradiation, D retention is about 30% lower than for pure D. In addition, plasma exposure experiment was also conducted in TEXTOR, followed by NRA. Higher retention in TFGR W-1.1 wt%TiC could be attributed to high grain boundary diffusion (then trapping deeper into the bulk) and formation of TiD2.

本文言語英語
ページ(範囲)S1052-S1054
ジャーナルJournal of Nuclear Materials
438
SUPPL
DOI
出版ステータス出版済み - 2013

!!!All Science Journal Classification (ASJC) codes

  • 核物理学および高エネルギー物理学
  • 材料科学(全般)
  • 原子力エネルギーおよび原子力工学

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