Development of a Frequency Comb Sweep Microwave Reflectometer in the Linear Device PANTA

Boyu Zhang, Shigeru Inagaki, Yuichi Kawachi

研究成果: Contribution to journalArticle査読

抄録

A frequency comb sweep microwave reflectometer is developed in panta to realize multi-point electron density measurements with high temporal resolution. A radial profile of the electron density is successfully reconstructed from simultaneous 17-point measurements with 2-μs temporal resolution. This result demonstrates the reliability and feasibility of the system for electron density profile diagnostics.

本文言語英語
ページ(範囲)1201131-1-1201131-3
ジャーナルPlasma and Fusion Research
14
DOI
出版ステータス出版済み - 2019

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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