Development of an advanced low-energy electron diffraction technique using field-emitted electrons from scanning tunneling microscope tips

Seigi Mizuno

    研究成果: ジャーナルへの寄稿学術誌査読

    12 被引用数 (Scopus)

    抄録

    The demonstration of a prototype instrument was presented which employed a new technique for determination of surface structures. The instrument consisted of a detector for projecting electron scattering patterns and a scanning tunneling microscope (STM) tip as a field emission gun. The tips operation under a field emission condition with 14 - 50 V bias voltages made it possible to observe the electron scattering patterns. Comparison of the experimentally obtained patterns was done with calculated results showing close correlation, signifying that the obtained patterns were caused by the electrons scattered on a sample surface after emission from a STM tip.

    本文言語英語
    ページ(範囲)1874-1878
    ページ数5
    ジャーナルJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
    19
    5
    DOI
    出版ステータス出版済み - 9月 2001

    !!!All Science Journal Classification (ASJC) codes

    • 凝縮系物理学
    • 電子工学および電気工学

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