Development of total internal reflection raman microscope with an apparatus for adhesion test and changes in depolarization ratio of polymer brush by compressive force

Saburo Yamamoto, Tatsuya Kubozono, Ken Kojio, Atsushi Takahara

研究成果: ジャーナルへの寄稿記事

抄録

A new total internal reflection (TIR) Raman microscope that can be used for adhesion testing based on the Johnson-Kendall-Roberts (JKR) theory was developed. The angle and the focus of the laser beam can be accurately controlled by observing the image of the laser spot on a CCD camera in the spectrometer. As a result, strong Raman signals were obtained. It was observed that the depolarization ratio of polymer brushes changes with the compressive force. This equipment is useful for the analysis of the interface and the anisotropic structure of polymer thin films.

元の言語英語
ページ(範囲)673-680
ページ数8
ジャーナルKobunshi Ronbunshu
72
発行部数11
DOI
出版物ステータス出版済み - 2015

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Depolarization
Brushes
CCD cameras
adhesion
Polymer films
Laser beams
Spectrometers
Polymers
Microscopes
Adhesion
polymer
laser
Thin films
Lasers
Testing
spectrometer
test
analysis

All Science Journal Classification (ASJC) codes

  • Chemical Engineering (miscellaneous)
  • Materials Science (miscellaneous)
  • Environmental Science(all)
  • Polymers and Plastics

これを引用

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AU - Takahara, Atsushi

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