Development of total internal reflection raman microscope with an apparatus for adhesion test and changes in depolarization ratio of polymer brush by compressive force

Saburo Yamamoto, Tatsuya Kubozono, Ken Kojio, Atsushi Takahara

研究成果: ジャーナルへの寄稿学術誌査読

抄録

A new total internal reflection (TIR) Raman microscope that can be used for adhesion testing based on the Johnson-Kendall-Roberts (JKR) theory was developed. The angle and the focus of the laser beam can be accurately controlled by observing the image of the laser spot on a CCD camera in the spectrometer. As a result, strong Raman signals were obtained. It was observed that the depolarization ratio of polymer brushes changes with the compressive force. This equipment is useful for the analysis of the interface and the anisotropic structure of polymer thin films.

本文言語英語
ページ(範囲)673-680
ページ数8
ジャーナルKOBUNSHI RONBUNSHU
72
11
DOI
出版ステータス出版済み - 2015

!!!All Science Journal Classification (ASJC) codes

  • 化学工学(その他)
  • 材料科学(その他)
  • 環境科学(全般)
  • ポリマーおよびプラスチック

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