Direct imaging of electron recombination and transport on a semiconductor surface by femtosecond time-resolved photoemission electron microscopy

Keiki Fukumoto, Yuki Yamada, Ken Onda, Shin Ya Koshihara

研究成果: Contribution to journalArticle査読

32 被引用数 (Scopus)

抄録

Much effort has been devoted to the development of techniques to probe carrier dynamics, which govern many semiconductor device characteristics. We report direct imaging of electron dynamics on semiconductor surfaces by time-resolved photoemission electron microscopy using femtosecond laser pulses. The experiments utilized a variable-repetition-rate femtosecond laser system to suppress sample charging problems. The recombination of photogenerated electrons and the lateral motion of the electrons driven by an external electric field on a GaAs surface were visualized. The mobility was estimated from a linear relationship between the drift velocity and the potential gradient.

本文言語英語
論文番号053117
ジャーナルApplied Physics Letters
104
5
DOI
出版ステータス出版済み - 2 3 2014
外部発表はい

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(その他)

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