Direct photo emission motion observation of current filaments in the IGBT under avalanche breakdown condition

Koichi Endo, Shinji Nagamine, Wataru Saito, Tomoko Matsudai, Tsuneo Ogura, Takashi Setoya, Koji Nakamae

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

9 被引用数 (Scopus)

抄録

Many recent studies have been reported that the current distribution has non-uniformity in IGBT under Unclamped inductive switching (UIS) condition. Those discussions are based on the calculation result performed using device simulators. And, the observation of thermal action of device has been reported by using the IR thermography. The non-uniform temperature distribution on chip and thermal map change at every several micro second periods. In this study, time resolved emission (TRE) microscopy was used to get highly precise data. The probability distribution of current in the IGBT under UIS condition was observed. Also, a change of current distribution dependent on the time and motion of current concentration were detected. These areas of high current density existence probability move along termination region of device 1.75μs after avalanche breakdown with damping. This is the first study to show the direct motion observation of photon emission from the current fllamentation in IGBT under avalanche breakdown condition.

本文言語英語
ホスト出版物のタイトルProceedings of the 2016 28th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2016
出版社Institute of Electrical and Electronics Engineers Inc.
ページ367-370
ページ数4
ISBN(電子版)9781467387682
DOI
出版ステータス出版済み - 7 25 2016
外部発表はい
イベント28th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2016 - Prague, チェコ共和国
継続期間: 6 12 20166 16 2016

出版物シリーズ

名前Proceedings of the International Symposium on Power Semiconductor Devices and ICs
2016-July
ISSN(印刷版)1063-6854

会議

会議28th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2016
Countryチェコ共和国
CityPrague
Period6/12/166/16/16

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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