Distribution-controlled X-identification for effective reduction of launch-induced IR-drop in at-speed scan testing

Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara

研究成果: Contribution to journalArticle査読

抄録

Test data modification based on test relaxation and Xfilling is the preferred approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlled X-Identification (DC-XID), which controls the distribution of X-bits identified in a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experiments on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without lowering fault coverage, increasing test data volume and circuit size.

本文言語英語
ページ(範囲)1216-1226
ページ数11
ジャーナルIEICE Transactions on Information and Systems
E94-D
6
DOI
出版ステータス出版済み - 6 2011

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

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