Dominant Timing Direct Identification for Radiation Noise due to Extended Double Pulse Test on Bare SiC MOSFET and Si RC-IGBT Chips

Toshiya Tadakuma, Koichi Nishi, Michael Rogers, Masahito Shoyama

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

2 被引用数 (Scopus)

抄録

This paper describes a practical methodology to identify dominant switching timing directly with current dependency relative to radiation noise in switching power devices. Using an expanded double pulse test method on a half bridge circuit, it is possible to measure radiation noise as a switching characteristic the same as loss, time or switching speed. As a result, it is possible for power device makers to adjust in device development stage without building a total system. The methodology is introduced with results of power chips with different properties, SiC MOSFET and Si RC-IGBT. In future work, the results will be utilized to optimize not only the basic system but also power device structures.

本文言語英語
ホスト出版物のタイトル2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2020
出版社Institute of Electrical and Electronics Engineers Inc.
ページ73-78
ページ数6
ISBN(電子版)9781728174303
DOI
出版ステータス出版済み - 7 2020
イベント2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2020 - Reno, 米国
継続期間: 7 28 20208 28 2020

出版物シリーズ

名前2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2020

会議

会議2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2020
国/地域米国
CityReno
Period7/28/208/28/20

All Science Journal Classification (ASJC) codes

  • 電子工学および電気工学
  • 安全性、リスク、信頼性、品質管理
  • 放射線
  • 信号処理
  • 情報システムおよび情報管理

フィンガープリント

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