Dual-mode Raman method to measure in-plane and interfacial thermophysical properties of 2D van der Waals heterostructures

研究成果: 著書/レポートタイプへの貢献会議での発言

元の言語英語
ホスト出版物のタイトル2017 MRS Spring Meeting
出版場所Phoenix, Arizona, US
出版物ステータス出版済み - 4 17 2017

これを引用

Dual-mode Raman method to measure in-plane and interfacial thermophysical properties of 2D van der Waals heterostructures. / Li, Qinyi; Zhang, Xing; Takahashi, Koji.

2017 MRS Spring Meeting. Phoenix, Arizona, US, 2017.

研究成果: 著書/レポートタイプへの貢献会議での発言

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title = "Dual-mode Raman method to measure in-plane and interfacial thermophysical properties of 2D van der Waals heterostructures",
author = "Qinyi Li and Xing Zhang and Koji Takahashi",
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AU - Zhang, Xing

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PY - 2017/4/17

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M3 - Conference contribution

BT - 2017 MRS Spring Meeting

CY - Phoenix, Arizona, US

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