Dynamic observation of dislocation movement across twin boundaries in the lamellar structure of TiAl intermetallic compound

T. Hanamura, R. Uemori, M. Tanino, H. Morikawa

研究成果: Contribution to journalArticle査読

1 被引用数 (Scopus)

抄録

Mechanisms of enhancement of plastic deformation in TiAl responsible for ductility improvement of this material, have been studied by high-voltage electron microscopy (HVEM) and atom probe field ion microscopy (AP-FIM). During cross-twinning, a dislocation interaction occurs at twin boundaries. Dislocation networks and fine Ti3Al particles on the pre-existing twin boundaries promote the formation and movement of twinning partial dislocations, contributing to an improvement of ductility.

本文言語英語
ページ(範囲)86-91
ページ数6
ジャーナルUltramicroscopy
39
1-4
DOI
出版ステータス出版済み - 11 2 1991
外部発表はい

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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