Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection

Koen Joosse, Hiroshi Nakagawa, Hiroshi Akoh, Susumu Takada, Keisuke Maehata, Kenji Ishibashi

研究成果: ジャーナルへの寄稿学術誌査読

12 被引用数 (Scopus)

抄録

Nb/Al-AlOx/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.

本文言語英語
ページ(範囲)2633-2637
ページ数5
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
35
5 SUPPL. A
出版ステータス出版済み - 5月 1 1996

!!!All Science Journal Classification (ASJC) codes

  • 工学(全般)
  • 物理学および天文学(全般)

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