Efficient testing of software product lines via centralization (short paper)

Lei Ma, Cyrille Artho, Cheng Zhang, Hiroyuki Sato

研究成果: ジャーナルへの寄稿記事

抄録

Software product line (SPL) engineering manages families of software products that share common features. However, cost-effective test case generation for an SPL is challenging. Applying existing test case generation techniques to each product variant separately may test common code in a redundant way. Moreover, it is difficult to share the test results among multiple product variants. In this paper, we propose the use of centralization, which combines multiple product variants from the same SPL and generates test cases for the entire system. By taking into account all variants, our technique generally avoids generating redundant test cases for common software components. Our case study on three SPLs shows that compared with testing each variant independently, our technique is more efficient and achieves higher test coverage.

元の言語英語
ページ(範囲)49-52
ページ数4
ジャーナルACM SIGPLAN Notices
50
発行部数3
DOI
出版物ステータス出版済み - 1 1 2015
外部発表Yes

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Testing
Costs

All Science Journal Classification (ASJC) codes

  • Computer Science(all)

これを引用

Efficient testing of software product lines via centralization (short paper). / Ma, Lei; Artho, Cyrille; Zhang, Cheng; Sato, Hiroyuki.

:: ACM SIGPLAN Notices, 巻 50, 番号 3, 01.01.2015, p. 49-52.

研究成果: ジャーナルへの寄稿記事

Ma, Lei ; Artho, Cyrille ; Zhang, Cheng ; Sato, Hiroyuki. / Efficient testing of software product lines via centralization (short paper). :: ACM SIGPLAN Notices. 2015 ; 巻 50, 番号 3. pp. 49-52.
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