TY - JOUR
T1 - Electroluminescence of 2,4-bis(4- (2′ -thiophene-yl)phenyl)thiophene in organic light-emitting field-effect transistors
AU - Oyamada, Takahito
AU - Sasabe, Hiroyuki
AU - Adachi, Chihaya
AU - Okuyama, Suguru
AU - Shimoji, Noriyuki
AU - Matsushige, Kazumi
PY - 2005/2/28
Y1 - 2005/2/28
N2 - We succeeded in observing electroluminescence (EL) of 2,4-bis(4- (2′ -thiophene-yl)phenyl)thio-phene (TPTPT) as an active layer in an organic field-effect transistor (OFET). In particular, an OFET with a short channel of dSD=0.8 μm demonstrated higher EL efficiency than one with a much longer channel (dSD =9.8 μm). We observed a maximum EL quantum efficiency (ηmax) of 6.4×10-3 % in the short-channel-length device at an applied source-drain voltage of Vd=-100 V and a gate voltage of Vg=-40 V. From the OFET characteristics, although the TPTPT layer demonstrated typical p -type operation, the occurrence of EL clearly indicated simultaneous hole and electron injection from the source and drain electronics, respectively, under high Vd and Vg.
AB - We succeeded in observing electroluminescence (EL) of 2,4-bis(4- (2′ -thiophene-yl)phenyl)thio-phene (TPTPT) as an active layer in an organic field-effect transistor (OFET). In particular, an OFET with a short channel of dSD=0.8 μm demonstrated higher EL efficiency than one with a much longer channel (dSD =9.8 μm). We observed a maximum EL quantum efficiency (ηmax) of 6.4×10-3 % in the short-channel-length device at an applied source-drain voltage of Vd=-100 V and a gate voltage of Vg=-40 V. From the OFET characteristics, although the TPTPT layer demonstrated typical p -type operation, the occurrence of EL clearly indicated simultaneous hole and electron injection from the source and drain electronics, respectively, under high Vd and Vg.
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U2 - 10.1063/1.1870105
DO - 10.1063/1.1870105
M3 - Article
AN - SCOPUS:17044367928
SN - 0003-6951
VL - 86
SP - 1
EP - 3
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 9
M1 - 093505
ER -