Electron tomography of dislocation structures

G. S. Liu, S. D. House, J. Kacher, M. Tanaka, K. Higashida, I. M. Robertson

    研究成果: ジャーナルへの寄稿簡易調査査読

    30 被引用数 (Scopus)

    抄録

    Recent developments in the application of electron tomography for characterizing microstructures in crystalline solids are described. The underlying principles for electron tomography are presented in the context of typical challenges in adapting the technique to crystalline systems and in using diffraction contrast imaging conditions. Methods for overcoming the limitations associated with the angular range, the number of acquired images, and uniformity of image contrast are introduced. In addition, a method for incorporating the real space coordinate system into the tomogram is presented. As the approach emphasizes development of experimental solutions to the challenges, the solutions developed and implemented are presented in the form of examples.

    本文言語英語
    ページ(範囲)1-11
    ページ数11
    ジャーナルMaterials Characterization
    87
    DOI
    出版ステータス出版済み - 2014

    All Science Journal Classification (ASJC) codes

    • 材料科学(全般)
    • 凝縮系物理学
    • 材料力学
    • 機械工学

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