Electronic structure changes across the valence transition in EuNi 2(Si0.2Ge0.8)2

P. A. Rayjada, A. Chainani, K. Kanai, T. Haruna, T. Yokoya, S. Shin, H. Wada, M. Shiga

研究成果: Contribution to journalArticle査読

6 被引用数 (Scopus)

抄録

We study the electronic structure of EuNi2(Si 0.2Ge0.8)2, which exhibits a temperature dependent mixed valence transition, using 4d-4f resonant photoemission spectroscopy (RESPES), x-ray absorption spectroscopy (XAS) and temperature-dependent ultraviolet photoemission spectroscopy (UPS). The RESPES studies identify the divalent and trivalent Eu 4f character density of states (DOS) which participate in the valence transition. Using the photoionization cross section variation as a function of photon energy, we discuss the Eu, Ni, and Ge-Si partial DOS in the valence band. The bulk divalent Eu 4f character states are centered at a binding energy of about 0.75 eV, significantly away from the Fermi level. While the surface divalent feature is negligibly affected, the spectra obtained using He IIα UPS exhibit temperature dependent bulk Eu 4f character states. The bulk divalent spectral weight is transferred to the high energy trivalent states, across the valence transition temperature, T υ ∼ 80 K. The He Iα UPS also exhibit spectral intensity changes across Tυ. The non-f character conduction band states at and near the Fermi level exhibit spectral weight changes up to 350 meV with a small energy (∼25 meV) temperature dependent pseudogaplike feature. The results suggest an increase in effective hybridization strength between the conduction and 4f electrons in the low temperature nearly trivalent phase. While the 4f character changes across Tυ are qualitatively consistent with change in valence configurations, the temperature dependent spectral changes in the non-f character DOS indicate direct participation in the valence transition in EuNi2(Si 0.2Ge0.8)2.

本文言語英語
ページ(範囲)1-7
ページ数7
ジャーナルPhysical Review B - Condensed Matter and Materials Physics
70
23
DOI
出版ステータス出版済み - 12 1 2004
外部発表はい

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

フィンガープリント 「Electronic structure changes across the valence transition in EuNi <sub>2</sub>(Si<sub>0.2</sub>Ge<sub>0.8</sub>)<sub>2</sub>」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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