Surface aggregation behavior in blends of poly(4-trimethylsilylstyrene) (PTMSS) and polyisoprene (PI) mostly composed of 1,2 and 3,4-addition microstructures was investigated by atomic force microscopy (AFM). Below a lower critical solution temperature (LCST), the blend films were miscible in bulk and smooth at the surface. On the other hand, above LCST, the phase-separated structure was observed in bulk by optical microscopy, however, the surface still remained smooth, indicating that phase-separation did not take place. This result means that the phase-separation at PTMSS/PI blend films surface is prevented due to strong segregation of PTMSS at the surface.
|ホスト出版物のタイトル||54th SPSJ Annual Meeting 2005 - Polymer Preprints, Japan|
|出版ステータス||出版済み - 2005|
|イベント||54th SPSJ Annual Meeting 2005 - Yokohama, 日本|
継続期間: 5 25 2005 → 5 27 2005
|その他||54th SPSJ Annual Meeting 2005|
|Period||5/25/05 → 5/27/05|
All Science Journal Classification (ASJC) codes