Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters

M. Uchida, Y. Toyota, H. Nakamura, S. Sagara, K. Kumamara, K. Wada, J. Murata

研究成果: 著書/レポートタイプへの貢献会議での発言

2 引用 (Scopus)

抜粋

A failure diagnosis system is proposed which can deal with large-scale, nonlinear, and time-varying plants. It is based on a novel identification method of small variations of parameters, which is named the SANQ (simulator-based approach to neat and quick system identification) method. The method does not require enriching input signals for the purpose of identification; with this system, one can estimate both the location and the injury of the failure neatly and quickly. In order to deal with large-scale plants, the plants are divided into small blocks. This reduces the number of parameters to be estimated at one time. The SANQ method provides estimates of the state variables of plants as well. Consequently, an model reference adaptive control system combined with the SANQ method will be a very useful scheme in recovering a faulted plant. The overall system consisting of the functions of diagnosis of a failure, estimation of dynamic property after failure, and appropriate control which leads to the ideal state will raise the reliability of the plant operation.

元の言語英語
ホスト出版物のタイトルIECON Proceedings (Industrial Electronics Conference)
出版者Publ by IEEE
ページ149-154
ページ数6
ISBN(印刷物)0879426888
出版物ステータス出版済み - 12 1 1991
外部発表Yes
イベントProceedings of the 1991 International Conference on Industrial Electronics, Control and Instrumentation - IECON '91 - Kobe, Jpn
継続期間: 10 28 199111 1 1991

出版物シリーズ

名前IECON Proceedings (Industrial Electronics Conference)
1

その他

その他Proceedings of the 1991 International Conference on Industrial Electronics, Control and Instrumentation - IECON '91
Kobe, Jpn
期間10/28/9111/1/91

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

フィンガープリント Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Uchida, M., Toyota, Y., Nakamura, H., Sagara, S., Kumamara, K., Wada, K., & Murata, J. (1991). Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters. : IECON Proceedings (Industrial Electronics Conference) (pp. 149-154). (IECON Proceedings (Industrial Electronics Conference); 巻数 1). Publ by IEEE.